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Paper Publications

150. Hung N.P., Ali M.Y., Y.Q. Fu, Ong N.S. and Tay M.L, Surface Integrity and Removal Rate of Silicon Sputtered with Focused Ion Beam, Journal of Machining Science and Technology, Vol. 5(2), pp. 239-254 （2001）.

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Pre One:151. Ong N. S., Koh Y. H. and Y. Q. Fu, Microlens array produced using hot embossing process, Microelectronics Engineering, 60, 365-379 (2002).

Next One:149. N.P. Hung, Yongqi Fu, Effect of crystalline orientation in ductile-regime machining. International Journal of Advanced Manufacturing Technology, Vol. 16, No. 12, 871~876 (2000).

Stephen Fu

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