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    高斌

    • 教授 博士生导师
    • 性别:男
    • 毕业院校:英国纽卡斯尔大学
    • 学历:博士研究生毕业
    • 学位:哲学博士学位
    • 在职信息:在职人员
    • 所在单位:自动化工程学院
    • 学科:信号与信息处理
      检测技术与自动化装置
      测试计量技术及仪器
    • 办公地点:C2-403
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    Smooth Nonnegative Matrix Factorization for defect detection using Microwave Non-destructive Testing and Evaluation

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    发表刊物:IEEE Transactions on Instrumentation and Measurement

    摘要:This paper addresses the interpolation issue of current spectral estimation methods in Microwave-based non-destructive testing and evaluation (NDT&E).  We developed a spatial-frequency feature extraction algorithm for defect detection with an open-ended waveguide system using Smooth Itakura-Saito Nonnegative Matrix Factorization (S-ISNMF).  In addition, the mathematical models of spatial-frequency characteristics for both defects and non-defects areas are derived. The newly developed algorithm has two prominent characteristics which benefits the detection system.

    全部作者:Bin Gao, Hong Zhang, W.L. Woo, Gui Yun Tian, Libing Bai, Aijun Yin

    学科门类:工学

    卷号:63

    期号:4

    页面范围:923 – 934

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    发表时间:2014-03-06