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发表刊物:IEEE Transactions on Instrumentation and Measurement
全部作者:Yukuan Kang,Jiacheng Li,Bin Gao
第一作者:Jing Zhou
通讯作者:Yang Zheng,Dong Liu
是否译文:否
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下一条:Physics-guided intelligent tomography sensing system for non-destructive testing based on neuromorphic eddy current circuit array and physical electromagnetic dynamics model