Current imaging and electromigration-induced splitting of GaN nanowires as revealed by conductive atomic force microscopy
点击次数：
备注：ACS Nano, 4, 4, 2422-2428, 2010.
全部作者：D. Golberg, Y. Bando,C. Li
是否译文：否
点击次数：
备注：ACS Nano, 4, 4, 2422-2428, 2010.
全部作者：D. Golberg, Y. Bando,C. Li
是否译文：否