李靖
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Pre One:Jing Li, Ning Ning, Ling Du, Qi Yu, and Yang Liu. The impact of gate leakage current on PLL in 65 nm technology: analysis and optimization[J]. Journal of Semiconductor Technology and Science, 2012, 12(1):99-105
Next One:Jing Li, Yang Liu, Shuangyi Wu, Chang Yang, Ning Ning, Qi Yu. Design of a fast locking DLL with background timing skew calibration[J]. Nanoscience and Nanotechnology Letters, 2014, 6(12):1068-1074
Release time:2021-04-15