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A Built-In Self-Test (BIST) System with Non-Intrusive TPG and ORA for FPGA Test and Diagnosis

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Note:Microelectronics Reliability (Elsevier), Vol.53,Issue 3, pp.488-498, March 2013.

All the Authors: et al,Aiwu Ruan

Translation or Not:no

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阮爱武

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