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- L. Zhang, H. Wang, et al., "Fast stress analysis for runtime reliability enhancement of 3D IC using artificial neural network"

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Journal:International Symposium on Quality Electronic Design (ISQED)

Page Number:173-178

Translation or Not:no

Date of Publication:2016-03-01

Date of Publication:2016-03-01

Attachments:

Pre One:- H. Zhao, Z. Qi, S. Wang, K. Vafai, H. Wang, H. Chen, S. Tan, "Learning-based occupancy behavior detection for smart buildings"

Next One:- K. He, S. Tan, H. Wang, G. Shi, "GPU-accelerated parallel sparse LU factorization method for fast circuit analysis"

王海

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Philosophy Status:Professor E-Mail:

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