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Paper Publications
- H. Wang, T. Xiao, D. Huang, L. Zhang, et al., "Runtime stress estimation for 3D IC reliability management using artificial neural network"
2019-11-12 Hits:Journal:ACM Transactions on Design Automation of Electronics Systems (TODAES), CCF B类期刊
Translation or Not:no
Date of Publication:2019-11-01
Date of Publication:2019-11-01
Attachments:
Gender:Male
Education Level:With Certificate of Graduation for Doctorate Study
Degree:Doctor of Philosophy
Status:Professor
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