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一种基于局部像素值的液晶屏缺陷检测方法

Date:2019-08-12

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Affilication of Author(s):电子科技大学

Teaching and Research Group:现代光电测控及仪器实验室

Type of Patent:发明

State of Patent:Authorized patents

Application Number:201510391088.9

Number of Inventors:10

Service Invention or Not:no

Application Date:2015-07-06

Authorization Date:2018-01-12

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