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一种各向异性导电膜中粒子的检测方法

Date:2019-08-12

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Affilication of Author(s):电子科技大学

Teaching and Research Group:现代光电测控及仪器实验室

Type of Patent:发明

State of Patent:Authorized patents

Application Number:201510140140.3

Number of Inventors:11

Service Invention or Not:no

Application Date:2015-03-30

Authorization Date:2017-06-13

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