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一种陶瓷基片表面的微带线电路线宽制造误差检测方法

Date:2019-08-13

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Affilication of Author(s):电子科技大学

Teaching and Research Group:现代光电测控及仪器实验室

Type of Patent:发明

State of Patent:Authorized patents

Application Number:201310432828.X

Number of Inventors:9

Service Invention or Not:no

Application Date:2013-09-22

Authorization Date:2015-09-09

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