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光电码盘缺陷检测系统及其实现方法

Date:2019-08-13

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Affilication of Author(s):电子科技大学

Teaching and Research Group:现代光电测控及仪器实验室

Type of Patent:发明

State of Patent:Authorized patents

Application Number:201310408081.4

Number of Inventors:9

Service Invention or Not:no

Application Date:2013-09-10

Authorization Date:2015-08-19

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