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Fault modeling on complex plane and tolerance handling methods for analog-circuit fault diagnosis (18).

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Note:IEEE Transactions On Instrumentation And Measurement, 2013,62(10):2730-2738

All the Authors:Fang Chen., Jianguo Huang, Zhen Liu, Shulin Tian,Chenglin Yang

Translation or Not:no

Pre One:Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis (70).

Next One:Complex Field Fault Modeling Based Optimal Frequency Selection in Linear Analog Circuit Fault Diagnosis(20).

杨成林

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Engineering Status:Professor E-Mail:

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