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Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis (70).

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Note:IEEE Transactions On Instrumentation And Measurement,2011, 60(1):176-185

All the Authors: Fang Chen., Bing Long, Shulin Tian,Chenglin Yang

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Pre One:Application of heuristic graph search to test points selection for analog fault dictionary techniques (57)

Next One:Fault modeling on complex plane and tolerance handling methods for analog-circuit fault diagnosis (18).

杨成林

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