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Application of heuristic graph search to test points selection for analog fault dictionary techniques (57)

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Note:IEEE Transactions On Instrumentation And Measurement, 2009, 58(7):2145-2158

All the Authors: Bing Long., Shulin Tian,Chenglin Yang

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Pre One:A test points selection method for analog fault dictionary techniques (53)

Next One:Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis (70).

杨成林

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Engineering Status:Professor E-Mail:

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