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Paper Publications
Y Zhang, M Hartmann, S Hermann, T Yang, Y Zhang, M Schröter, “Extraction of the Contact Resistance of Carbon Nanotube Field Effect Transistors Using the Bias Extrapolation Method and Statistical Measurements,” IEEE Transactions on Electron Devices, 2023, 70 (11), 6057 - 6063.
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Education Level:With Certificate of Graduation for Doctorate Study
Degree:Doctor of Engineering
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