Yelei Yao
Hits:
Journal:IEEE ELECTRON DEVICE LETTERS
First Author:Yelei Yao
Volume:39
Issue:3
Page Number:436-439
Translation or Not:no
Date of Publication:2018-04-30
Pre One:Automatic Hot-Test System for High Average/Continuous-Wave Power Gyro-TWTs
Next One:HE04 Mode Exciters With Flat Transmission and High Mode Purity for Confocal Gyro-TWAs
Release time:2024-05-17