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and Eckhard Mueller, Impact of the film thickness and substrate on the thermopower measurement of thermoelectric films by the potential-Seebeck microprobe (PSM).
Hits:Note:Applied Thermal Engineering 107 (2016) 552-559.
All the Authors: Pawel Ziolkowski, Dongyan Xu, Chao Wang, Qiang Zhao, Jingze Li, Bin Yang, Xu Yao, Weihang Wang,Aijun Zhou*
Translation or Not:no