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Dielectric charging induced drift in micro device reliability-a review

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Journal:Microelectronics Reliability

All the Authors:Jiangbo He,Xiaoping He,Huijun Yua,Bei Peng

First Author:Wu Zhou*

Volume:66

Page Number:1–9

Translation or Not:no

Date of Publication:2016-09-10

Date of Publication:2016-09-10

Pre One:Effects of dielectric charging on the output voltage of a capacitive accelerometer

Next One:Investigation of the Thermal Drift of MEMS Capacitive Accelerometers Induced by the Overflow of Die Attachment Adhesive

周吴

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Alma Mater:Southwest Jiaotong University Degree:Doctor of Engineering Status:Professor School/Department:University of Electronic Science and Technology of China E-Mail:

Recommended Ph.D.Supervisor 》

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