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An Automatic Test Approach for Field Programmable Gate Array (FPGA)

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Note:The 12th IEEE International Symposium on Integrated Circuits (ISIC 2009), Singapore, Dec.2009..

All the Authors: et al,A.W. Ruan

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阮爱武

Gender:Female Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Engineering Status:Professor E-Mail:

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