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Release time:2019-08-08
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Affiliation of Author(s):UESTC
Teaching and Research Group:CRFICS
Journal:IEEE Transactions on Circuits and Systems I: Regular Papers
Key Words:Capacitors , Dynamic range , Complexity theory , Hardware , Calibration , Linearity , Quantization (
Indexed by:Applied Research
Volume:66
Issue:4
Page Number:1342-1354
Translation or Not:no
Date of Publication:2018-11-28
Device mismatch is a key concern for high-resolution data converters. This paper presents a comprehensive study of the error-feedback (EF)-based mismatch error shaping (MES) technique. EF MES overcomes the key challenge of the classic dynamic element matching-based MES whose complexity grows exponentially with the number of bits; however, the prior EF MES comes with the limitations of limited shaping capability and reduced dynamic range. This paper demonstrates how to perform more advanced EF MES for various types of data converters. Moreover, this paper also proposes the use of digital predic
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