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A test points selection method for analog fault dictionary techniques (53)

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Note:. Analog Integrated Circuits and Signal Processing, 2010, 63(2):349-357

All the Authors: Bing Long., Shulin Tian,Chenglin Yang

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Pre One:Test points selection for analog fault dictionary techniques (51).

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杨成林

Gender:Male Education Level:With Certificate of Graduation for Doctorate Study Degree:Doctor of Engineering Status:Professor E-Mail:

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